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Creator of CasaXPS, Neal Fairley has worked in the field of surface analysis for 27 years and has developed CasaXPS for over 20 years. Experience of ToF SIMS, Dynamic SIMS and electron spectroscopy data acquisition and analysis systems, coupled with a background in computational mathematical physics and numerical analysis is the basis from which CasaXPS is developed.
Vincent Fernandez has worked in the field of surface analysis for 29 years and is head of surface analysis X-ray photo electron service since 2 decades. He is experienced in using synchrotron facilities Bessy and ESRF since 4 years. He was the organizer of 3 XPS workshops.
The course will cover the latest developments in instrument optimization and data treatment. The course is suitable for people experienced in XPS and XPS data analysis. A series of examples will be used to explain new and old features in CasaXPS. Supervised sessions with videos and data will be part of the short course providing hands-on experience of topics covered during lecture sessions.
Identification of oxidation states, preparation of peak models for polymers, analysis of heterogeneous samples and manipulation of data to extract sample chemical information. Understanding the relationship between instrumentation and quantification by XPS. The emphasis will be on extracting self-consistent information from XPS data sets in terms of peak models and atomic concentration.
|Type of registration||Profile||Fee|
|Short course only||Regular||200 €|
|Student *||140 €|
|Short course fee for conference participants||Regular||150 €|
|Student *||120 €|
|Coffee and soft drinks are included.
Minimum Number of participants: 7
* A copy of the Student ID will be required to validate the registration.